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  1. ELECTRICAL PROCESSES IN ENGINEERING AND CHEMISTRY, Vol. 47 (2011), Issue 4, p. 150-159

    Analysis of Electrostatic Ion-Cyclotron Instability Driven by Parallel Flow Velocity Shear

    Tyagi R.K., Srivastava K.K., Pandey R.S.

    Download full-text PDF. 974 downloads

  2. Vol. 49 (2013), Issue 1, p. 81-85

    Theoretical Analysis of Silicon Surface Roughness Induced by Plasma Etching

    Tyagi R.K.

    Download full-text PDF. 1011 downloads

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